TY - JOUR

T1 - Thermal expansion of Ti-Al-N and Cr-Al-N coatings

AU - Bartosik, Matthias

AU - Holec, David

AU - Apel, D.

AU - Klaus, M.

AU - Genzel, Christoph

AU - Keckes, Jozef

AU - Arndt, Mirjam

AU - Polcik, Peter

AU - Koller, Christian Martin

AU - Mayrhofer, Paul Heinz

PY - 2017

Y1 - 2017

N2 - The thermal expansion coefficients (TECs) of B1 structured Ti1 − xAlxN and Cr1 − xAlxN thin films – investigated by synchrotron X-ray diffraction from room temperature to 600 °C – excellently agree with ab initio obtained temperature dependent calculations only if they were annealed at 600 °C. As-deposited thin films, with their built-in structural defects show a lower temperature dependence of their TECs and higher values. Furthermore, our data clearly show that the TECs of cubic Ti1 − xAlxN and Cr1 − xAlxN increase with increasing Al content, and that the TEC of wurtzite type B4 structured AlN is only about half of that of B1 AlN.

AB - The thermal expansion coefficients (TECs) of B1 structured Ti1 − xAlxN and Cr1 − xAlxN thin films – investigated by synchrotron X-ray diffraction from room temperature to 600 °C – excellently agree with ab initio obtained temperature dependent calculations only if they were annealed at 600 °C. As-deposited thin films, with their built-in structural defects show a lower temperature dependence of their TECs and higher values. Furthermore, our data clearly show that the TECs of cubic Ti1 − xAlxN and Cr1 − xAlxN increase with increasing Al content, and that the TEC of wurtzite type B4 structured AlN is only about half of that of B1 AlN.

KW - Thermal expansion

KW - TiN

KW - CrN

KW - Ti-Al-N

KW - Cr-Al-N

KW - AlN

KW - Ab initio

U2 - 10.1016/j.scriptamat.2016.09.022

DO - 10.1016/j.scriptamat.2016.09.022

M3 - Article

VL - 127.2017

SP - 182

EP - 185

JO - Scripta materialia

JF - Scripta materialia

SN - 1359-6462

IS - 15 January

ER -