Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction. / Rachbauer, Richard; Massl, S.; Stergar, Erich et al.
2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Rachbauer, R, Massl, S, Stergar, E, Keckes, J & Mayrhofer, PH 2010, 'Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction', International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich, 30/05/10 - 3/06/10.
APA
Rachbauer, R., Massl, S., Stergar, E., Keckes, J., & Mayrhofer, P. H. (2010). Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Vancouver
Rachbauer R, Massl S, Stergar E, Keckes J, Mayrhofer PH. Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction. 2010. Postersitzung präsentiert bei International Workshop on In situ characterization of near-surface processes, Eisenerz, Österreich.
Author
Bibtex - Download
@conference{6bd77fcfa1dc452fb8b02ab36ec0ca26,
title = "Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction",
author = "Richard Rachbauer and S. Massl and Erich Stergar and J. Keckes and Mayrhofer, {Paul Heinz}",
year = "2010",
language = "English",
note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Thermal decomposition of Ti1-xAlxN thin films in the focus of 3D-atom probe, transmission electron microscopy and X-ray diffraction
AU - Rachbauer, Richard
AU - Massl, S.
AU - Stergar, Erich
AU - Keckes, J.
AU - Mayrhofer, Paul Heinz
PY - 2010
Y1 - 2010
M3 - Poster
T2 - International Workshop on In situ characterization of near-surface processes
Y2 - 30 May 2010 through 3 June 2010
ER -
