Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy. / Kiener, Daniel; Minor, Andrew M.
in: Acta materialia, Jahrgang 59, 2011, S. 1328-1337.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{9233e56ff15943ad8861aacb709661aa,
title = "Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy",
author = "Daniel Kiener and Minor, {Andrew M.}",
year = "2011",
doi = "10.1016/j.actamat.2010.10.065",
language = "English",
volume = "59",
pages = "1328--1337",
journal = "Acta materialia",
issn = "1359-6454",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Source controlled yield and hardening of Cu(100) studied by in situ transmission electron microscopy

AU - Kiener, Daniel

AU - Minor, Andrew M.

PY - 2011

Y1 - 2011

U2 - 10.1016/j.actamat.2010.10.065

DO - 10.1016/j.actamat.2010.10.065

M3 - Article

VL - 59

SP - 1328

EP - 1337

JO - Acta materialia

JF - Acta materialia

SN - 1359-6454

ER -