Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Size effect in metallic thin films characterized by low-temperature X-ray diffraction. / Eiper, Ernst; Martinschitz, Klaus Jürgen; Dehm, Gerhard et al.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

Eiper, E, Martinschitz, KJ, Dehm, G & Keckes, J 2006, 'Size effect in metallic thin films characterized by low-temperature X-ray diffraction', Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, USA / Vereinigte Staaten, 30/07/06 - 4/08/06.

Eiper, E., Martinschitz, K. J., Dehm, G., & Keckes, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Eiper E, Martinschitz KJ, Dehm G , Keckes J. Size effect in metallic thin films characterized by low-temperature X-ray diffraction. 2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

Eiper, Ernst ; Martinschitz, Klaus Jürgen ; Dehm, Gerhard et al. / Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.

@conference{36fed0b04a184904a822b21f39f8b836,

title = "Size effect in metallic thin films characterized by low-temperature X-ray diffraction",

author = "Ernst Eiper and Martinschitz, {Klaus J{\"u}rgen} and Gerhard Dehm and Jozef Keckes",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}

TY - CONF

T1 - Size effect in metallic thin films characterized by low-temperature X-ray diffraction

AU - Eiper, Ernst

AU - Martinschitz, Klaus Jürgen

AU - Dehm, Gerhard

AU - Keckes, Jozef

PY - 2006

Y1 - 2006

M3 - Poster

T2 - Gordon Research Conference on thin film & small scale mechanical behavior

Y2 - 30 July 2006 through 4 August 2006

ER -

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