Publikationen

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2012
Veröffentlicht
Quantum mechanically guided design of Co43Fe20Ta5.5X31.5 (X=B, Si, P, S) metallic glasses
Hostert, C., Music, D., Bednarcik, J., Keckes, J. & Schneider, J. M., 2012, in: Journal of physics (Condensed matter). S. 175402-175411
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Silver nanoparticles sintering at low temperature on a copper substrate: In situ characterisation under inert atmosphere and air
Zalesak, J., 2012, in: Journal of Mining and Metallurgy, Section B: Metallurgy. 48, 1, S. 63-71 9 S.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction
Daniel, R., Keckes, J. & Mitterer, C., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
TEM characterization of CrN thin films epitaxially grown on MgO (001)
Harzer, T. P., Kormout, K., Daniel, R., Mitterer, C., Dehm, G. & Zhang, Z. L., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
The structure and mechanical properties of spines from the cactus Opuntia ficus-indica
Gindl-Altmutter, W. & Keckes, J., 2012, in: BioResources. 7, 1, S. 1232-1237
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Thermally treated hard coatings characterized by XRD coupled with four-point bending
Steffenelli, M., Riedl, A., Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2012.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
TiO2 (100) Al2O3 (0001) interface: A first-principles study supported by experiment
Popov, M., Spitaler, J., Mühlbacher, M., Walter, C., Keckes, J., Mitterer, C. & Draxl, C., 2012, in: Physical review : B, Condensed matter and materials physics. 86, S. 2053091-20530913
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, in: Scripta materialia. 67, S. 748-751
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
2011
Veröffentlicht
Ab initio molecular dynamics model for density, elastic properties and short range order of Co–Fe–Ta–B metallic glass thin films
Hostert, C., Music, D., Bednarcik, J., Keckes, J., Kapaklis, V., Hjövarsson, B. & Schneider, J. M., 2011, in: European physical journal B, Condensed matter physics : EPJ B. S. 4754011-4754017
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)

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Publikationen

Quantum mechanically guided design of Co43Fe20Ta5.5X31.5 (X=B, Si, P, S) metallic glasses

Silver nanoparticles sintering at low temperature on a copper substrate: In situ characterisation under inert atmosphere and air

Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

TEM characterization of CrN thin films epitaxially grown on MgO (001)

The structure and mechanical properties of spines from the cactus Opuntia ficus-indica

Thermally treated hard coatings characterized by XRD coupled with four-point bending

TiO2 (100) Al2O3 (0001) interface: A first-principles study supported by experiment

X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

Ab initio molecular dynamics model for density, elastic properties and short range order of Co–Fe–Ta–B metallic glass thin films

Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

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