Publikationen

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2011
Veröffentlicht
Carrier transfer effect on transport in p-i-n structures with Ge quantum dots
Lysenko, V. S., Gomeniuk, Y. V., Strelchuk, V. V., Nikolenko, A. S., Kondratenko, S. V., Kozyrev, Y. N., Rubezhanska, M. Y. & Teichert, C., 2011, in: Physical review : B, Condensed matter and materials physics. 84, S. 115425-1-15425-9
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, in: Solar energy materials and solar cells. 95, S. 1949-1954
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Teichert, C. & Beinik, I., 2011, Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. S. 691-721
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Buch/Sammelband › Forschung
Veröffentlicht
Contact angle and AFM roughness measurements of polymer coated steel samples
Lugger, M. & Teichert, C., 2011
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Contact angle measurements on coated samples
Ganser, C., Schmied, F. & Teichert, C., 2011
Publikationen: Buch/Bericht › Forschungsbericht › Transfer › (peer-reviewed)
Veröffentlicht
Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling
Lorbek, S., Teichert, C. & Hlawacek, G., 2011, in: European physical journal, The / Applied physics : EPJ. 55, S. 23902-1-23902-5
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Diffusion and submonolayer growth of para-sexiphenyl on Ir(111) and Ir(111)-supported graphene
Hlawacek, G., Khokar, F. S., van Gastel, R., Teichert, C. & Poelsema, B., 2011, in: IBM journal of research and development [Elektronische Ressource]. 55, S. 15:1-15:7
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Veröffentlicht
Effect of Ge nanoislandson lateral photoconductivity of Ge-SiOx-Si structures
Lysenko, V. S., Gomeniuk, Y. V., Kozyrev, Y. N., Rubezhanska, M. Y., Sklyar, V. K., Kondratenko, S. V., Melnichuk, Y. Y. & Teichert, C., 2011, Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices: selected, peer reviewed papers from the 6th International Workshop on Semiconductor-on-Insulator Materials and Devices, 24 - 28 October, 2010 Kyiv, Ukraine . S. 179-186 (Advanced materials research; Band 276).
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Veröffentlicht
Electrical Transport of Single ZnO Nanorods studied by Photo- Conductive AFM
Kratzer, M., Beinik, I., Teichert, C., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Veröffentlicht
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, in: Journal of applied physics. 110, S. 052005-1-052005-7
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)

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Publikationen

Carrier transfer effect on transport in p-i-n structures with Ge quantum dots

Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications

Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

Contact angle and AFM roughness measurements of polymer coated steel samples

Contact angle measurements on coated samples

Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

Diffusion and submonolayer growth of para-sexiphenyl on Ir(111) and Ir(111)-supported graphene

Effect of Ge nanoislandson lateral photoconductivity of Ge-SiOx-Si structures

Electrical Transport of Single ZnO Nanorods studied by Photo- Conductive AFM

Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

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