Scanning Probe Microscopy-based Characterization of ZnO Nanorods
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Scanning Probe Microscopy-based Characterization of ZnO Nanorods. / Teichert, Christian; Hou, Yue; Beinik, Igor et al.
Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439.
Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Teichert, C, Hou, Y, Beinik, I, Chen, Y, Djuricis, A, Anwand, W & Brauer, G 2010, Scanning Probe Microscopy-based Characterization of ZnO Nanorods. in Abstract CD IEEE International NanoElectronics Conference (INEC 2010). S. 438-439.
APA
Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W., & Brauer, G. (2010). Scanning Probe Microscopy-based Characterization of ZnO Nanorods. In Abstract CD IEEE International NanoElectronics Conference (INEC 2010) (S. 438-439)
Vancouver
Teichert C, Hou Y, Beinik I, Chen Y, Djuricis A, Anwand W et al. Scanning Probe Microscopy-based Characterization of ZnO Nanorods. in Abstract CD IEEE International NanoElectronics Conference (INEC 2010). 2010. S. 438-439
Author
Bibtex - Download
@inproceedings{ac905615f2844b3a881e95f737bb388b,
title = "Scanning Probe Microscopy-based Characterization of ZnO Nanorods",
author = "Christian Teichert and Yue Hou and Igor Beinik and Yinyi Chen and A. Djuricis and W. Anwand and G. Brauer",
year = "2010",
language = "English",
pages = "438--439",
booktitle = "Abstract CD IEEE International NanoElectronics Conference (INEC 2010)",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Scanning Probe Microscopy-based Characterization of ZnO Nanorods
AU - Teichert, Christian
AU - Hou, Yue
AU - Beinik, Igor
AU - Chen, Yinyi
AU - Djuricis, A.
AU - Anwand, W.
AU - Brauer, G.
PY - 2010
Y1 - 2010
M3 - Conference contribution
SP - 438
EP - 439
BT - Abstract CD IEEE International NanoElectronics Conference (INEC 2010)
ER -
