Quantitative Approaches for in situ SEM and TEM Deformation Studies
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Quantitative Approaches for in situ SEM and TEM Deformation Studies. / Dehm, Gerhard; Kiener, Daniel; Motz, Christian et al.
in: Microscopy and microanalysis, Jahrgang 18, 2012, S. 736-737.
in: Microscopy and microanalysis, Jahrgang 18, 2012, S. 736-737.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Dehm, G, Kiener, D, Motz, C, Pippan, R & Smolka, M 2012, 'Quantitative Approaches for in situ SEM and TEM Deformation Studies', Microscopy and microanalysis, Jg. 18, S. 736-737. https://doi.org/10.1017/S1431927612005533
APA
Dehm, G., Kiener, D., Motz, C., Pippan, R., & Smolka, M. (2012). Quantitative Approaches for in situ SEM and TEM Deformation Studies. Microscopy and microanalysis, 18, 736-737. https://doi.org/10.1017/S1431927612005533
Vancouver
Dehm G, Kiener D, Motz C, Pippan R, Smolka M. Quantitative Approaches for in situ SEM and TEM Deformation Studies. Microscopy and microanalysis. 2012;18:736-737. doi: 10.1017/S1431927612005533
Author
Bibtex - Download
@article{d0e9c1881ea84250ba342012e828185f,
title = "Quantitative Approaches for in situ SEM and TEM Deformation Studies",
author = "Gerhard Dehm and Daniel Kiener and Christian Motz and Reinhard Pippan and Martin Smolka",
year = "2012",
doi = "10.1017/S1431927612005533",
language = "English",
volume = "18",
pages = "736--737",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Quantitative Approaches for in situ SEM and TEM Deformation Studies
AU - Dehm, Gerhard
AU - Kiener, Daniel
AU - Motz, Christian
AU - Pippan, Reinhard
AU - Smolka, Martin
PY - 2012
Y1 - 2012
U2 - 10.1017/S1431927612005533
DO - 10.1017/S1431927612005533
M3 - Article
VL - 18
SP - 736
EP - 737
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
ER -
