Quantitative Approaches for in situ SEM and TEM Deformation Studies

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Quantitative Approaches for in situ SEM and TEM Deformation Studies. / Dehm, Gerhard; Kiener, Daniel; Motz, Christian et al.
In: Microscopy and microanalysis, Vol. 18, 2012, p. 736-737.

Research output: Contribution to journalArticleResearchpeer-review

Vancouver

Dehm G, Kiener D, Motz C, Pippan R, Smolka M. Quantitative Approaches for in situ SEM and TEM Deformation Studies. Microscopy and microanalysis. 2012;18:736-737. doi: 10.1017/S1431927612005533

Bibtex - Download

@article{d0e9c1881ea84250ba342012e828185f,
title = "Quantitative Approaches for in situ SEM and TEM Deformation Studies",
author = "Gerhard Dehm and Daniel Kiener and Christian Motz and Reinhard Pippan and Martin Smolka",
year = "2012",
doi = "10.1017/S1431927612005533",
language = "English",
volume = "18",
pages = "736--737",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Quantitative Approaches for in situ SEM and TEM Deformation Studies

AU - Dehm, Gerhard

AU - Kiener, Daniel

AU - Motz, Christian

AU - Pippan, Reinhard

AU - Smolka, Martin

PY - 2012

Y1 - 2012

U2 - 10.1017/S1431927612005533

DO - 10.1017/S1431927612005533

M3 - Article

VL - 18

SP - 736

EP - 737

JO - Microscopy and microanalysis

JF - Microscopy and microanalysis

SN - 1431-9276

ER -