Novel technique to determine elastic constants of thin films
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Novel technique to determine elastic constants of thin films. / Martinschitz, Klaus; Daniel, Rostislav; Mitterer, Christian et al.
Material Research Society Symposium Proceedings 1139. 2009. S. 115-120.
Material Research Society Symposium Proceedings 1139. 2009. S. 115-120.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Martinschitz, K, Daniel, R, Mitterer, C & Keckes, J 2009, Novel technique to determine elastic constants of thin films. in Material Research Society Symposium Proceedings 1139. S. 115-120.
APA
Martinschitz, K., Daniel, R., Mitterer, C., & Keckes, J. (2009). Novel technique to determine elastic constants of thin films. In Material Research Society Symposium Proceedings 1139 (S. 115-120)
Vancouver
Martinschitz K, Daniel R, Mitterer C, Keckes J. Novel technique to determine elastic constants of thin films. in Material Research Society Symposium Proceedings 1139. 2009. S. 115-120
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Bibtex - Download
@inproceedings{6d87f28d3e7e4852950687d095c5c888,
title = "Novel technique to determine elastic constants of thin films",
author = "Klaus Martinschitz and Rostislav Daniel and Christian Mitterer and Jozef Keckes",
year = "2009",
language = "English",
pages = "115--120",
booktitle = "Material Research Society Symposium Proceedings 1139",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Novel technique to determine elastic constants of thin films
AU - Martinschitz, Klaus
AU - Daniel, Rostislav
AU - Mitterer, Christian
AU - Keckes, Jozef
PY - 2009
Y1 - 2009
M3 - Conference contribution
SP - 115
EP - 120
BT - Material Research Society Symposium Proceedings 1139
ER -
