Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. / Kremmer, Sascha; Wurmbauer, Harald; Andreev, Andrei et al.
2006. Postersitzung präsentiert bei 14th International Winterschool on New Developments in Solid State Physics, Mauterndorf, Österreich.
2006. Postersitzung präsentiert bei 14th International Winterschool on New Developments in Solid State Physics, Mauterndorf, Österreich.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Kremmer, S, Wurmbauer, H, Andreev, A, Teichert, C, Tallarida, G, Spiga, S, Wiemer, C & Fanciulli, M 2006, 'Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy', 14th International Winterschool on New Developments in Solid State Physics, Mauterndorf, Österreich, 13/02/06 - 17/02/06.
APA
Kremmer, S., Wurmbauer, H., Andreev, A., Teichert, C., Tallarida, G., Spiga, S., Wiemer, C., & Fanciulli, M. (2006). Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. Postersitzung präsentiert bei 14th International Winterschool on New Developments in Solid State Physics, Mauterndorf, Österreich.
Vancouver
Kremmer S, Wurmbauer H, Andreev A, Teichert C, Tallarida G, Spiga S et al.. Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy. 2006. Postersitzung präsentiert bei 14th International Winterschool on New Developments in Solid State Physics, Mauterndorf, Österreich.
Author
Bibtex - Download
@conference{13c76756048d46f5a6d9311620cea3a1,
title = "Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy",
author = "Sascha Kremmer and Harald Wurmbauer and Andrei Andreev and Christian Teichert and G. Tallarida and S. Spiga and C. Wiemer and M. Fanciulli",
year = "2006",
language = "English",
note = "14th International Winterschool on New Developments in Solid State Physics ; Conference date: 13-02-2006 Through 17-02-2006",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
AU - Kremmer, Sascha
AU - Wurmbauer, Harald
AU - Andreev, Andrei
AU - Teichert, Christian
AU - Tallarida, G.
AU - Spiga, S.
AU - Wiemer, C.
AU - Fanciulli, M.
PY - 2006
Y1 - 2006
M3 - Poster
T2 - 14th International Winterschool on New Developments in Solid State Physics
Y2 - 13 February 2006 through 17 February 2006
ER -
