Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
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Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films. / Keckes, Jozef; Daniel, Rostislav; Bartosik, M. et al.
Proceeding of International Conference on Metallurgical Coatings and Thin Films. 2011. S. 55-55.
Proceeding of International Conference on Metallurgical Coatings and Thin Films. 2011. S. 55-55.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Keckes, J, Daniel, R, Bartosik, M, Mitterer, C, Schoeder, S & Burghammer, M 2011, Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films. in Proceeding of International Conference on Metallurgical Coatings and Thin Films. S. 55-55.
APA
Keckes, J., Daniel, R., Bartosik, M., Mitterer, C., Schoeder, S., & Burghammer, M. (2011). Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films. In Proceeding of International Conference on Metallurgical Coatings and Thin Films (S. 55-55)
Vancouver
Keckes J, Daniel R, Bartosik M, Mitterer C, Schoeder S, Burghammer M. Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films. in Proceeding of International Conference on Metallurgical Coatings and Thin Films. 2011. S. 55-55
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Bibtex - Download
@inproceedings{e418f85bdaaa4aceb3bacfd3f820e43d,
title = "Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films",
author = "Jozef Keckes and Rostislav Daniel and M. Bartosik and Christian Mitterer and S Schoeder and M. Burghammer",
year = "2011",
language = "English",
pages = "55--55",
booktitle = "Proceeding of International Conference on Metallurgical Coatings and Thin Films",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Nano-beam-x-ray diffraction reveals strain, composition, texture and crystal size gradients across nano-crystalline thin films
AU - Keckes, Jozef
AU - Daniel, Rostislav
AU - Bartosik, M.
AU - Mitterer, Christian
AU - Schoeder, S
AU - Burghammer, M.
PY - 2011
Y1 - 2011
M3 - Conference contribution
SP - 55
EP - 55
BT - Proceeding of International Conference on Metallurgical Coatings and Thin Films
ER -
