Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

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Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators. / Mirkowska, Monika; Kratzer, Markus; Teichert, Christian et al.
2013. Postersitzung präsentiert bei Annual Meeting of German Physical Society (DPG), Regensburg, Deutschland.

Publikationen: KonferenzbeitragPosterForschung(peer-reviewed)

Harvard

Mirkowska, M, Kratzer, M, Teichert, C & Flachberger, H 2013, 'Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators', Annual Meeting of German Physical Society (DPG), Regensburg, Deutschland, 12/03/13 - 14/03/13.

APA

Mirkowska, M., Kratzer, M., Teichert, C., & Flachberger, H. (2013). Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators. Postersitzung präsentiert bei Annual Meeting of German Physical Society (DPG), Regensburg, Deutschland.

Vancouver

Mirkowska M, Kratzer M, Teichert C, Flachberger H. Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators. 2013. Postersitzung präsentiert bei Annual Meeting of German Physical Society (DPG), Regensburg, Deutschland.

Author

Mirkowska, Monika ; Kratzer, Markus ; Teichert, Christian et al. / Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators. Postersitzung präsentiert bei Annual Meeting of German Physical Society (DPG), Regensburg, Deutschland.

Bibtex - Download

@conference{64ca3820bfeb4e908c29dae26c5b583c,
title = "Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators",
author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",
year = "2013",
language = "English",
note = "Annual Meeting of German Physical Society (DPG) ; Conference date: 12-03-2013 Through 14-03-2013",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Kelvin probe force microscopy investigations of the contact charging of single crystalline insulators

AU - Mirkowska, Monika

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Flachberger, Helmut

PY - 2013

Y1 - 2013

M3 - Poster

T2 - Annual Meeting of German Physical Society (DPG)

Y2 - 12 March 2013 through 14 March 2013

ER -