Investigation of the fatigue behavior of Al thin films with different microstructure
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Investigation of the fatigue behavior of Al thin films with different microstructure. / Dehm, Gerhard; Heinz, Walther; Pippan, Reinhard.
in: Materials science and engineering: A, Structural materials: properties, microstructure and processing, 2010, S. 7757-7763.
in: Materials science and engineering: A, Structural materials: properties, microstructure and processing, 2010, S. 7757-7763.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Bibtex - Download
@article{aa7e29d25f8e45f6a2e71bb2d720116c,
title = "Investigation of the fatigue behavior of Al thin films with different microstructure",
author = "Gerhard Dehm and Walther Heinz and Reinhard Pippan",
year = "2010",
language = "English",
pages = "7757--7763",
journal = "Materials science and engineering: A, Structural materials: properties, microstructure and processing",
issn = "0921-5093",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Investigation of the fatigue behavior of Al thin films with different microstructure
AU - Dehm, Gerhard
AU - Heinz, Walther
AU - Pippan, Reinhard
PY - 2010
Y1 - 2010
M3 - Article
SP - 7757
EP - 7763
JO - Materials science and engineering: A, Structural materials: properties, microstructure and processing
JF - Materials science and engineering: A, Structural materials: properties, microstructure and processing
SN - 0921-5093
ER -
