Investigation of the fatigue behavior of Al thin films with different microstructure
Research output: Contribution to journal › Article › Research › peer-review
Standard
Investigation of the fatigue behavior of Al thin films with different microstructure. / Dehm, Gerhard; Heinz, Walther; Pippan, Reinhard.
In: Materials science and engineering: A, Structural materials: properties, microstructure and processing, 2010, p. 7757-7763.
In: Materials science and engineering: A, Structural materials: properties, microstructure and processing, 2010, p. 7757-7763.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
@article{aa7e29d25f8e45f6a2e71bb2d720116c,
title = "Investigation of the fatigue behavior of Al thin films with different microstructure",
author = "Gerhard Dehm and Walther Heinz and Reinhard Pippan",
year = "2010",
language = "English",
pages = "7757--7763",
journal = "Materials science and engineering: A, Structural materials: properties, microstructure and processing",
issn = "0921-5093",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Investigation of the fatigue behavior of Al thin films with different microstructure
AU - Dehm, Gerhard
AU - Heinz, Walther
AU - Pippan, Reinhard
PY - 2010
Y1 - 2010
M3 - Article
SP - 7757
EP - 7763
JO - Materials science and engineering: A, Structural materials: properties, microstructure and processing
JF - Materials science and engineering: A, Structural materials: properties, microstructure and processing
SN - 0921-5093
ER -
