In-Situ compression tests on micron-sized copper pillars
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
In-Situ compression tests on micron-sized copper pillars. / Kiener, Daniel; Motz, Christian; Dehm, Gerhard.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Kiener, D, Motz, C & Dehm, G 2006, 'In-Situ compression tests on micron-sized copper pillars', Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, USA / Vereinigte Staaten, 30/07/06 - 4/08/06.
APA
Kiener, D., Motz, C., & Dehm, G. (2006). In-Situ compression tests on micron-sized copper pillars. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Vancouver
Kiener D, Motz C, Dehm G. In-Situ compression tests on micron-sized copper pillars. 2006. Postersitzung präsentiert bei Gordon Research Conference on thin film & small scale mechanical behavior 2006, Waterville, Maine, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{0c15f5cb33a744618118d1e1e8d32e05,
title = "In-Situ compression tests on micron-sized copper pillars",
author = "Daniel Kiener and Christian Motz and Gerhard Dehm",
year = "2006",
language = "English",
note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - In-Situ compression tests on micron-sized copper pillars
AU - Kiener, Daniel
AU - Motz, Christian
AU - Dehm, Gerhard
PY - 2006
Y1 - 2006
M3 - Poster
T2 - Gordon Research Conference on thin film & small scale mechanical behavior
Y2 - 30 July 2006 through 4 August 2006
ER -
