In situ µLaue: Instrumental setup for the deformation of micron sized samples

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In situ µLaue: Instrumental setup for the deformation of micron sized samples. / Kirchlechner, Christoph; Keckes, Jozef; Micha, Jean-Sebastien et al.
in: Advanced engineering materials, Jahrgang 13, 2011, S. 837-844.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{dd366235b3d64b84adbf9597a04987f5,
title = "In situ µLaue: Instrumental setup for the deformation of micron sized samples",
author = "Christoph Kirchlechner and Jozef Keckes and Jean-Sebastien Micha and Gerhard Dehm",
year = "2011",
doi = "10.1002/adem.201000286",
language = "English",
volume = "13",
pages = "837--844",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - In situ µLaue: Instrumental setup for the deformation of micron sized samples

AU - Kirchlechner, Christoph

AU - Keckes, Jozef

AU - Micha, Jean-Sebastien

AU - Dehm, Gerhard

PY - 2011

Y1 - 2011

U2 - 10.1002/adem.201000286

DO - 10.1002/adem.201000286

M3 - Article

VL - 13

SP - 837

EP - 844

JO - Advanced engineering materials

JF - Advanced engineering materials

SN - 1438-1656

ER -