In situ µLaue: Instrumental setup for the deformation of micron sized samples
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
In situ µLaue: Instrumental setup for the deformation of micron sized samples. / Kirchlechner, Christoph; Keckes, Jozef; Micha, Jean-Sebastien et al.
in: Advanced engineering materials, Jahrgang 13, 2011, S. 837-844.
in: Advanced engineering materials, Jahrgang 13, 2011, S. 837-844.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Kirchlechner, C, Keckes, J, Micha, J-S & Dehm, G 2011, 'In situ µLaue: Instrumental setup for the deformation of micron sized samples', Advanced engineering materials, Jg. 13, S. 837-844. https://doi.org/10.1002/adem.201000286
APA
Vancouver
Kirchlechner C, Keckes J, Micha JS, Dehm G. In situ µLaue: Instrumental setup for the deformation of micron sized samples. Advanced engineering materials. 2011;13:837-844. doi: 10.1002/adem.201000286
Author
Bibtex - Download
@article{dd366235b3d64b84adbf9597a04987f5,
title = "In situ µLaue: Instrumental setup for the deformation of micron sized samples",
author = "Christoph Kirchlechner and Jozef Keckes and Jean-Sebastien Micha and Gerhard Dehm",
year = "2011",
doi = "10.1002/adem.201000286",
language = "English",
volume = "13",
pages = "837--844",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - In situ µLaue: Instrumental setup for the deformation of micron sized samples
AU - Kirchlechner, Christoph
AU - Keckes, Jozef
AU - Micha, Jean-Sebastien
AU - Dehm, Gerhard
PY - 2011
Y1 - 2011
U2 - 10.1002/adem.201000286
DO - 10.1002/adem.201000286
M3 - Article
VL - 13
SP - 837
EP - 844
JO - Advanced engineering materials
JF - Advanced engineering materials
SN - 1438-1656
ER -
