Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations

Publikationen: KonferenzbeitragVortragForschung(peer-reviewed)

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Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations. / Mühlbacher, Marlene; Mendez Martin, Francisca; Lu, Jun et al.
2015. European APT Workshop, Leoben, Österreich.

Publikationen: KonferenzbeitragVortragForschung(peer-reviewed)

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@conference{55f41bc7836842998f3e812ec5afd15d,
title = "Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations",
author = "Marlene M{\"u}hlbacher and {Mendez Martin}, Francisca and Jun Lu and Nina Schalk and Lars Hultman and Christian Mitterer",
year = "2015",
language = "English",
note = "European APT Workshop ; Conference date: 06-10-2015 Through 09-10-2015",

}

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TY - CONF

T1 - Diffusion in the Cu/TiN thin film system studied by atom probe tomography correlated with transmission electron microscopy and first-principles calculations

AU - Mühlbacher, Marlene

AU - Mendez Martin, Francisca

AU - Lu, Jun

AU - Schalk, Nina

AU - Hultman, Lars

AU - Mitterer, Christian

PY - 2015

Y1 - 2015

M3 - Presentation

T2 - European APT Workshop

Y2 - 6 October 2015 through 9 October 2015

ER -