Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling
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Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling. / Lorbek, Stefan; Teichert, Christian; Hlawacek, Gregor.
in: European physical journal, The / Applied physics : EPJ, Jahrgang 55, 2011, S. 23902-1-23902-5.
in: European physical journal, The / Applied physics : EPJ, Jahrgang 55, 2011, S. 23902-1-23902-5.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Lorbek S, Teichert C, Hlawacek G. Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling. European physical journal, The / Applied physics : EPJ. 2011;55:23902-1-23902-5. doi: 10.1051/epjap/2011100428
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Bibtex - Download
@article{e1e34b7f5d42440b90eea83deafb7a65,
title = "Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling",
author = "Stefan Lorbek and Christian Teichert and Gregor Hlawacek",
year = "2011",
doi = "10.1051/epjap/2011100428",
language = "English",
volume = "55",
pages = "23902--1--23902--5",
journal = "European physical journal, The / Applied physics : EPJ",
issn = "1286-0042",
publisher = "EDP Sciences",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling
AU - Lorbek, Stefan
AU - Teichert, Christian
AU - Hlawacek, Gregor
PY - 2011
Y1 - 2011
U2 - 10.1051/epjap/2011100428
DO - 10.1051/epjap/2011100428
M3 - Article
VL - 55
SP - 23902-1-23902-5
JO - European physical journal, The / Applied physics : EPJ
JF - European physical journal, The / Applied physics : EPJ
SN - 1286-0042
ER -
