Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions
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Standard
Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions. / Fuchs, Peter F.; Pinter, Gerald; Krivec, Thomas.
15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. 2014. S. 1-8.
15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. 2014. S. 1-8.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Fuchs, PF, Pinter, G & Krivec, T 2014, Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions. in 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. S. 1-8.
APA
Fuchs, P. F., Pinter, G., & Krivec, T. (2014). Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions. In 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (S. 1-8)
Vancouver
Fuchs PF, Pinter G, Krivec T. Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions. in 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems. 2014. S. 1-8
Author
Bibtex - Download
@inproceedings{09b6b10d0374428fb3999a2f78b52ba5,
title = "Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions",
author = "Fuchs, {Peter F.} and Gerald Pinter and Thomas Krivec",
year = "2014",
language = "Deutsch",
pages = "1--8",
booktitle = "15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions
AU - Fuchs, Peter F.
AU - Pinter, Gerald
AU - Krivec, Thomas
PY - 2014
Y1 - 2014
M3 - Beitrag in Konferenzband
SP - 1
EP - 8
BT - 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
ER -
