Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air. / Kovalcík, J.; Dusza, J.; Lube, T. et al.
in: Materials letters, Jahrgang 58, Nr. 6, 01.02.2004, S. 871-875.
in: Materials letters, Jahrgang 58, Nr. 6, 01.02.2004, S. 871-875.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Kovalcík, J, Dusza, J, Lube, T & Danzer, R 2004, 'Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air', Materials letters, Jg. 58, Nr. 6, S. 871-875. https://doi.org/10.1016/j.matlet.2003.08.002
APA
Kovalcík, J., Dusza, J., Lube, T., & Danzer, R. (2004). Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air. Materials letters, 58(6), 871-875. https://doi.org/10.1016/j.matlet.2003.08.002
Vancouver
Kovalcík J, Dusza J, Lube T, Danzer R. Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air. Materials letters. 2004 Feb 1;58(6):871-875. doi: 10.1016/j.matlet.2003.08.002
Author
Bibtex - Download
@article{ea035337dd8f4b2dbe17de38529f44c2,
title = "Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air",
keywords = "Delayed failure, Silicon nitride, Slow crack growth creep, Time to failure",
author = "J. Kovalc{\'i}k and J. Dusza and T. Lube and R. Danzer",
year = "2004",
month = feb,
day = "1",
doi = "10.1016/j.matlet.2003.08.002",
language = "English",
volume = "58",
pages = "871--875",
journal = "Materials letters",
issn = "0167-577X",
publisher = "Elsevier",
number = "6",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Delayed failure behaviour of the ESIS silicon nitride reference material at 1200 °C in air
AU - Kovalcík, J.
AU - Dusza, J.
AU - Lube, T.
AU - Danzer, R.
PY - 2004/2/1
Y1 - 2004/2/1
KW - Delayed failure
KW - Silicon nitride
KW - Slow crack growth creep
KW - Time to failure
UR - http://www.scopus.com/inward/record.url?scp=0346341012&partnerID=8YFLogxK
U2 - 10.1016/j.matlet.2003.08.002
DO - 10.1016/j.matlet.2003.08.002
M3 - Article
AN - SCOPUS:0346341012
VL - 58
SP - 871
EP - 875
JO - Materials letters
JF - Materials letters
SN - 0167-577X
IS - 6
ER -
