Defect induced shortening of excess carrier lifetime in single period nipi structures
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Defect induced shortening of excess carrier lifetime in single period nipi structures. / Span, Gerhard; Oswald, Josef; Heigl, Gernot.
in: Materials science and technology, Jahrgang 14, 1998, S. 1307-1313.
in: Materials science and technology, Jahrgang 14, 1998, S. 1307-1313.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Span, G, Oswald, J & Heigl, G 1998, 'Defect induced shortening of excess carrier lifetime in single period nipi structures', Materials science and technology, Jg. 14, S. 1307-1313.
APA
Span, G., Oswald, J., & Heigl, G. (1998). Defect induced shortening of excess carrier lifetime in single period nipi structures. Materials science and technology, 14, 1307-1313.
Vancouver
Span G, Oswald J, Heigl G. Defect induced shortening of excess carrier lifetime in single period nipi structures. Materials science and technology. 1998;14:1307-1313.
Author
Bibtex - Download
@article{d7c217fc790d4690ba03e9bfa1c50b57,
title = "Defect induced shortening of excess carrier lifetime in single period nipi structures",
author = "Gerhard Span and Josef Oswald and Gernot Heigl",
year = "1998",
language = "English",
volume = "14",
pages = "1307--1313",
journal = "Materials science and technology",
issn = "0267-0836",
publisher = "Maney Publishing",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Defect induced shortening of excess carrier lifetime in single period nipi structures
AU - Span, Gerhard
AU - Oswald, Josef
AU - Heigl, Gernot
PY - 1998
Y1 - 1998
M3 - Article
VL - 14
SP - 1307
EP - 1313
JO - Materials science and technology
JF - Materials science and technology
SN - 0267-0836
ER -
