Defect induced shortening of excess carrier lifetime in single period nipi structures

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

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Defect induced shortening of excess carrier lifetime in single period nipi structures. / Span, Gerhard; Oswald, Josef; Heigl, Gernot.
in: Materials science and technology, Jahrgang 14, 1998, S. 1307-1313.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Bibtex - Download

@article{d7c217fc790d4690ba03e9bfa1c50b57,
title = "Defect induced shortening of excess carrier lifetime in single period nipi structures",
author = "Gerhard Span and Josef Oswald and Gernot Heigl",
year = "1998",
language = "English",
volume = "14",
pages = "1307--1313",
journal = "Materials science and technology",
issn = "0267-0836",
publisher = "Maney Publishing",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Defect induced shortening of excess carrier lifetime in single period nipi structures

AU - Span, Gerhard

AU - Oswald, Josef

AU - Heigl, Gernot

PY - 1998

Y1 - 1998

M3 - Article

VL - 14

SP - 1307

EP - 1313

JO - Materials science and technology

JF - Materials science and technology

SN - 0267-0836

ER -