Critical thickness for GaN thin film on AlN substrate
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Standard
Critical thickness for GaN thin film on AlN substrate. / Coppeta, R.A.; Ceric, H; Holec, David et al.
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International. 2013. S. 133-136.
Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International. 2013. S. 133-136.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Coppeta, RA, Ceric, H, Holec, D & Grasser, T 2013, Critical thickness for GaN thin film on AlN substrate. in Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International. S. 133-136. https://doi.org/10.1109/IIRW.2013.6804177
APA
Coppeta, R. A., Ceric, H., Holec, D., & Grasser, T. (2013). Critical thickness for GaN thin film on AlN substrate. In Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International (S. 133-136) https://doi.org/10.1109/IIRW.2013.6804177
Vancouver
Coppeta RA, Ceric H, Holec D, Grasser T. Critical thickness for GaN thin film on AlN substrate. in Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International. 2013. S. 133-136 doi: 10.1109/IIRW.2013.6804177
Author
Bibtex - Download
@inproceedings{b1241c0559ae4f76bac82c4b76215b6c,
title = "Critical thickness for GaN thin film on AlN substrate",
author = "R.A. Coppeta and H Ceric and David Holec and T. Grasser",
year = "2013",
doi = "10.1109/IIRW.2013.6804177",
language = "English",
pages = "133--136",
booktitle = "Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Critical thickness for GaN thin film on AlN substrate
AU - Coppeta, R.A.
AU - Ceric, H
AU - Holec, David
AU - Grasser, T.
PY - 2013
Y1 - 2013
U2 - 10.1109/IIRW.2013.6804177
DO - 10.1109/IIRW.2013.6804177
M3 - Conference contribution
SP - 133
EP - 136
BT - Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
ER -
