Compositional and structural evolution of sputtered Ti-Al-N
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Compositional and structural evolution of sputtered Ti-Al-N. / Chen, Li; Moser, Martin; Du, Yong et al.
in: Thin solid films, 2009, S. 6635-6641.
in: Thin solid films, 2009, S. 6635-6641.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Chen, L, Moser, M, Du, Y & Mayrhofer, PH 2009, 'Compositional and structural evolution of sputtered Ti-Al-N', Thin solid films, S. 6635-6641.
APA
Chen, L., Moser, M., Du, Y., & Mayrhofer, P. H. (2009). Compositional and structural evolution of sputtered Ti-Al-N. Thin solid films, 6635-6641.
Vancouver
Chen L, Moser M, Du Y, Mayrhofer PH. Compositional and structural evolution of sputtered Ti-Al-N. Thin solid films. 2009;6635-6641.
Author
Bibtex - Download
@article{d825a248bcd34e509e74e06a77180271,
title = "Compositional and structural evolution of sputtered Ti-Al-N",
author = "Li Chen and Martin Moser and Yong Du and Mayrhofer, {Paul Heinz}",
year = "2009",
language = "English",
pages = "6635--6641",
journal = "Thin solid films",
issn = "0040-6090",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Compositional and structural evolution of sputtered Ti-Al-N
AU - Chen, Li
AU - Moser, Martin
AU - Du, Yong
AU - Mayrhofer, Paul Heinz
PY - 2009
Y1 - 2009
M3 - Article
SP - 6635
EP - 6641
JO - Thin solid films
JF - Thin solid films
SN - 0040-6090
ER -
