Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration. / Beinik, Igor; Galiana, B.; Kratzer, Markus et al.
2010. Postersitzung präsentiert bei 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010", Mauterndorf, Österreich.
2010. Postersitzung präsentiert bei 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010", Mauterndorf, Österreich.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Beinik, I, Galiana, B, Kratzer, M, Rey-Stolle, I, Algora, C, Tejedor, P & Teichert, C 2010, 'Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration', 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010", Mauterndorf, Österreich, 22/02/10 - 26/02/10.
APA
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P., & Teichert, C. (2010). Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration. Postersitzung präsentiert bei 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010", Mauterndorf, Österreich.
Vancouver
Beinik I, Galiana B, Kratzer M, Rey-Stolle I, Algora C, Tejedor P et al.. Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration. 2010. Postersitzung präsentiert bei 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010", Mauterndorf, Österreich.
Author
Bibtex - Download
@conference{d5c8ba2809ff4a72b5aa8f1d6414277c,
title = "Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration",
author = "Igor Beinik and B. Galiana and Markus Kratzer and I. Rey-Stolle and C. Algora and Paloma Tejedor and Christian Teichert",
year = "2010",
language = "English",
note = "16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems {"}Mauterndorf 2010{"} ; Conference date: 22-02-2010 Through 26-02-2010",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
AU - Beinik, Igor
AU - Galiana, B.
AU - Kratzer, Markus
AU - Rey-Stolle, I.
AU - Algora, C.
AU - Tejedor, Paloma
AU - Teichert, Christian
PY - 2010
Y1 - 2010
M3 - Poster
T2 - 16th International Winterschool on New Developments in Solid State Physics: Low Dimensional Systems "Mauterndorf 2010"
Y2 - 22 February 2010 through 26 February 2010
ER -
