Auger and X-ray photoelectron spectroscopy on lithiated HOPG
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Auger and X-ray photoelectron spectroscopy on lithiated HOPG. / Hoffmann, Michael J.; Oswald, Stefan; Zier, M. et al.
in: Surface and interface analysis, Jahrgang 48.2016, Nr. 7, 08.04.2016, S. 501-504.
in: Surface and interface analysis, Jahrgang 48.2016, Nr. 7, 08.04.2016, S. 501-504.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Hoffmann, MJ, Oswald, S, Zier, M & Eckert, J 2016, 'Auger and X-ray photoelectron spectroscopy on lithiated HOPG', Surface and interface analysis, Jg. 48.2016, Nr. 7, S. 501-504. https://doi.org/10.1002/sia.6008
APA
Hoffmann, M. J., Oswald, S., Zier, M., & Eckert, J. (2016). Auger and X-ray photoelectron spectroscopy on lithiated HOPG. Surface and interface analysis, 48.2016(7), 501-504. https://doi.org/10.1002/sia.6008
Vancouver
Hoffmann MJ, Oswald S, Zier M, Eckert J. Auger and X-ray photoelectron spectroscopy on lithiated HOPG. Surface and interface analysis. 2016 Apr 8;48.2016(7):501-504. doi: 10.1002/sia.6008
Author
Bibtex - Download
@article{cb6913fa67274d1aba59920c5fdd66bc,
title = "Auger and X-ray photoelectron spectroscopy on lithiated HOPG",
keywords = "AES, lithiated HOPG, lithium, XPS",
author = "Hoffmann, {Michael J.} and Stefan Oswald and M. Zier and J{\"u}rgen Eckert",
year = "2016",
month = apr,
day = "8",
doi = "10.1002/sia.6008",
language = "English",
volume = "48.2016",
pages = "501--504",
journal = "Surface and interface analysis",
issn = "0142-2421",
publisher = "John Wiley & Sons, Gro{\ss}britannien",
number = "7",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Auger and X-ray photoelectron spectroscopy on lithiated HOPG
AU - Hoffmann, Michael J.
AU - Oswald, Stefan
AU - Zier, M.
AU - Eckert, Jürgen
PY - 2016/4/8
Y1 - 2016/4/8
KW - AES
KW - lithiated HOPG
KW - lithium
KW - XPS
UR - http://www.scopus.com/inward/record.url?scp=84979725344&partnerID=8YFLogxK
U2 - 10.1002/sia.6008
DO - 10.1002/sia.6008
M3 - Article
AN - SCOPUS:84979725344
VL - 48.2016
SP - 501
EP - 504
JO - Surface and interface analysis
JF - Surface and interface analysis
SN - 0142-2421
IS - 7
ER -
