Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM. / Zhang, Zaoli; Daniel, Rostislav; Mitterer, Christian.
2011. Postersitzung präsentiert bei Microscopy Conference (MC2011), Kiel, Deutschland.
2011. Postersitzung präsentiert bei Microscopy Conference (MC2011), Kiel, Deutschland.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Zhang, Z, Daniel, R & Mitterer, C 2011, 'Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM', Microscopy Conference (MC2011), Kiel, Deutschland, 28/08/11 - 2/09/11.
APA
Zhang, Z., Daniel, R., & Mitterer, C. (2011). Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM. Postersitzung präsentiert bei Microscopy Conference (MC2011), Kiel, Deutschland.
Vancouver
Zhang Z, Daniel R, Mitterer C. Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM. 2011. Postersitzung präsentiert bei Microscopy Conference (MC2011), Kiel, Deutschland.
Author
Bibtex - Download
@conference{3df5f71ad6fa44d887eb46698a61e1df,
title = "Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM",
author = "Zaoli Zhang and Rostislav Daniel and Christian Mitterer",
year = "2011",
language = "English",
note = "Microscopy Conference (MC2011) ; Conference date: 28-08-2011 Through 02-09-2011",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
AU - Zhang, Zaoli
AU - Daniel, Rostislav
AU - Mitterer, Christian
PY - 2011
Y1 - 2011
M3 - Poster
T2 - Microscopy Conference (MC2011)
Y2 - 28 August 2011 through 2 September 2011
ER -
