Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films
Research output: Contribution to journal › Article › Research › peer-review
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Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films. / Neidhardt, Jörg; Walter, Claudia; Molina-Aldareguia, J.M. et al.
In: Journal of applied physics, Vol. 103, 2008, p. 123515-1-123515-8.
In: Journal of applied physics, Vol. 103, 2008, p. 123515-1-123515-8.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Neidhardt, J, Walter, C, Molina-Aldareguia, JM, Herrmann, M, Clegg, WJ & Hultman, L 2008, 'Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films', Journal of applied physics, vol. 103, pp. 123515-1-123515-8. https://doi.org/10.1063/1.2939716
APA
Neidhardt, J., Walter, C., Molina-Aldareguia, J. M., Herrmann, M., Clegg, W. J., & Hultman, L. (2008). Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films. Journal of applied physics, 103, 123515-1-123515-8. https://doi.org/10.1063/1.2939716
Vancouver
Neidhardt J, Walter C, Molina-Aldareguia JM, Herrmann M, Clegg WJ, Hultman L. Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films. Journal of applied physics. 2008;103:123515-1-123515-8. doi: 10.1063/1.2939716
Author
Bibtex - Download
@article{2576a4f9abb5468eb1ffeadda2eb0dea,
title = "Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films",
author = "J{\"o}rg Neidhardt and Claudia Walter and J.M. Molina-Aldareguia and M. Herrmann and W.J. Clegg and L. Hultman",
year = "2008",
doi = "10.1063/1.2939716",
language = "English",
volume = "103",
pages = "123515--1--123515--8",
journal = "Journal of applied physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films
AU - Neidhardt, Jörg
AU - Walter, Claudia
AU - Molina-Aldareguia, J.M.
AU - Herrmann, M.
AU - Clegg, W.J.
AU - Hultman, L.
PY - 2008
Y1 - 2008
U2 - 10.1063/1.2939716
DO - 10.1063/1.2939716
M3 - Article
VL - 103
SP - 123515-1-123515-8
JO - Journal of applied physics
JF - Journal of applied physics
SN - 0021-8979
ER -
