Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films

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Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films. / Neidhardt, Jörg; Walter, Claudia; Molina-Aldareguia, J.M. et al.
In: Journal of applied physics, Vol. 103, 2008, p. 123515-1-123515-8.

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@article{2576a4f9abb5468eb1ffeadda2eb0dea,
title = "Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films",
author = "J{\"o}rg Neidhardt and Claudia Walter and J.M. Molina-Aldareguia and M. Herrmann and W.J. Clegg and L. Hultman",
year = "2008",
doi = "10.1063/1.2939716",
language = "English",
volume = "103",
pages = "123515--1--123515--8",
journal = "Journal of applied physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",

}

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TY - JOUR

T1 - Transmission electron microscopy studies and simulation of the indentation response of superelastic fullerenelike carbon nitride thin films

AU - Neidhardt, Jörg

AU - Walter, Claudia

AU - Molina-Aldareguia, J.M.

AU - Herrmann, M.

AU - Clegg, W.J.

AU - Hultman, L.

PY - 2008

Y1 - 2008

U2 - 10.1063/1.2939716

DO - 10.1063/1.2939716

M3 - Article

VL - 103

SP - 123515-1-123515-8

JO - Journal of applied physics

JF - Journal of applied physics

SN - 0021-8979

ER -