Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films

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Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films. / Ganser, Christian; Niegelhell, Katrin; Czibula, Caterina Marina et al.
In: Holzforschung : international journal of the biology, chemistry, physics and technology of wood , Vol. 70.2016, No. 12, 08.08.2016, p. 1115-1123.

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@article{93cdc73ede3c4212a57b01b478f93b95,
title = "Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films",
abstract = "Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.",
author = "Christian Ganser and Katrin Niegelhell and Czibula, {Caterina Marina} and Angela Chemelli and Christian Teichert and Robert Schennach and Stefan Spirk",
year = "2016",
month = aug,
day = "8",
doi = "10.1515/hf-2016-0023",
language = "English",
volume = "70.2016",
pages = "1115--1123",
journal = "Holzforschung : international journal of the biology, chemistry, physics and technology of wood ",
issn = "0018-3830",
publisher = "de Gruyter",
number = "12",

}

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TY - JOUR

T1 - Topography effects in AFM force mapping experiments on xylan-decorated cellulose thin films

AU - Ganser, Christian

AU - Niegelhell, Katrin

AU - Czibula, Caterina Marina

AU - Chemelli, Angela

AU - Teichert, Christian

AU - Schennach, Robert

AU - Spirk, Stefan

PY - 2016/8/8

Y1 - 2016/8/8

N2 - Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.

AB - Xylan-coated cellulose thin films has been investigated by means of atomic force microscopy (AFM) and force mapping experiments. The birch xylan deposition on the film was performed under control by means of a multiple parameter surface plasmon resonance spectroscopy (MP-SPR) under dynamic conditions. The coated films were submitted to AFM in phase imaging mode to force mapping with modified AFM tips (sensitive to hydrophilic OH and hydrophobic CH3 groups) in order to characterize and localize the xylan on the surfaces. At the first glance, a clear difference in the adhesion force between xylan-coated areas and cellulose has been observed. However, these different adhesion forces originate from topography effects, which prevent an unambiguous identification and subsequent localization of the xylan on the cellulosic surfaces.

U2 - 10.1515/hf-2016-0023

DO - 10.1515/hf-2016-0023

M3 - Article

VL - 70.2016

SP - 1115

EP - 1123

JO - Holzforschung : international journal of the biology, chemistry, physics and technology of wood

JF - Holzforschung : international journal of the biology, chemistry, physics and technology of wood

SN - 0018-3830

IS - 12

ER -