SYSTEM AND METHOD FOR THE DEFECT ANALYSIS OF WORKPIECES
Research output: Patent
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Original language | English |
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IPC | G01B11/04 |
Priority date | 12/12/06 |
Publication status | Published - 19 Jun 2008 |
Research output: Patent
Original language | English |
---|---|
IPC | G01B11/04 |
Priority date | 12/12/06 |
Publication status | Published - 19 Jun 2008 |