Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

Research output: Contribution to conferencePosterResearchpeer-review

Standard

Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction. / Daniel, Rostislav; Keckes, Jozef; Mitterer, Christian.
2012. Poster session presented at 9th International Conference on Residual Stresses, ICRS 2012, Garmisch-Partenkirchen, Austria.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Daniel, R, Keckes, J & Mitterer, C 2012, 'Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction', 9th International Conference on Residual Stresses, ICRS 2012, Garmisch-Partenkirchen, Austria, 7/10/12 - 9/10/12.

APA

Daniel, R., Keckes, J., & Mitterer, C. (2012). Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction. Poster session presented at 9th International Conference on Residual Stresses, ICRS 2012, Garmisch-Partenkirchen, Austria.

Vancouver

Daniel R, Keckes J, Mitterer C. Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction. 2012. Poster session presented at 9th International Conference on Residual Stresses, ICRS 2012, Garmisch-Partenkirchen, Austria.

Author

Daniel, Rostislav ; Keckes, Jozef ; Mitterer, Christian. / Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction. Poster session presented at 9th International Conference on Residual Stresses, ICRS 2012, Garmisch-Partenkirchen, Austria.

Bibtex - Download

@conference{37b8bee8b3664aa5beb9ba5d9bd1385b,
title = "Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction",
author = "Rostislav Daniel and Jozef Keckes and Christian Mitterer",
year = "2012",
language = "English",
note = "9th International Conference on Residual Stresses, ICRS 2012 ; Conference date: 07-10-2012 Through 09-10-2012",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

AU - Daniel, Rostislav

AU - Keckes, Jozef

AU - Mitterer, Christian

PY - 2012

Y1 - 2012

M3 - Poster

T2 - 9th International Conference on Residual Stresses, ICRS 2012

Y2 - 7 October 2012 through 9 October 2012

ER -