Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films

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Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films. / Keckes, Julius; Stefenelli, Mario; Todt, Juraj et al.
2015. Poster session presented at 7th Size & Strain, Oxford, United Kingdom.

Research output: Contribution to conferencePosterResearchpeer-review

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Keckes J, Stefenelli M, Todt J, Mitterer C, Daniel R, Keckes J. Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films. 2015. Poster session presented at 7th Size & Strain, Oxford, United Kingdom.

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Keckes, Julius ; Stefenelli, Mario ; Todt, Juraj et al. / Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films. Poster session presented at 7th Size & Strain, Oxford, United Kingdom.

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@conference{3c72677f3c224e5ab593a999e19493f0,
title = "Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films",
author = "Julius Keckes and Mario Stefenelli and Juraj Todt and Christian Mitterer and Rostislav Daniel and Jozef Keckes",
year = "2015",
language = "English",
note = "7th Size & Strain ; Conference date: 21-09-2015 Through 24-09-2015",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films

AU - Keckes, Julius

AU - Stefenelli, Mario

AU - Todt, Juraj

AU - Mitterer, Christian

AU - Daniel, Rostislav

AU - Keckes, Jozef

PY - 2015

Y1 - 2015

M3 - Poster

T2 - 7th Size & Strain

Y2 - 21 September 2015 through 24 September 2015

ER -