Research output

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1995
Published
Investigations of corrosion processes on cleavage edges of potash-lime silica glasses by Atomic Force Microscopy
Prohaska, T., FRIEDBACHER, G., GRASSERBAUER, M. & Schmitz, I., 1995, In: Fresenius' journal of analytical chemistry .
Research output: Contribution to journal › Article › Research › peer-review
Published
Maximum entropy deconvolution of AFM & STM images
Prohaska, T., Fuchs, G., FRIEDBACHER, G., Hutter, H. & GRASSERBAUER, M., 1995, In: Fresenius' journal of analytical chemistry. p. 143-147
Research output: Contribution to journal › Article › Research › peer-review
1994
Published
Development of crystallinity and morphology in hafnium dioxide thin films grown by Atomic Layer Epitaxy
Prohaska, T., Ritala, M., Leskelä, M., Niinistö, L., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Thin solid films. p. 72-80
Research output: Contribution to journal › Article › Research › peer-review
Published
In-Situ investigation of surface reactions on alkali halides by Atomic Force Microscopy
Prohaska, T., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Fresenius' journal of analytical chemistry .
Research output: Contribution to journal › Article › Research › peer-review
Published
Surface analysis with Atomic Force Microscopy through measurements in air and under liquids
Prohaska, T., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Microchimica acta. p. 179-202
Research output: Contribution to journal › Article › Research › peer-review
Published
Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films
Prohaska, T., Ritala, M., Leskelä, M., Niinistö, L., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Thin solid films. p. 155-162
Research output: Contribution to journal › Article › Research › peer-review

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Research Portal

Research output

Investigations of corrosion processes on cleavage edges of potash-lime silica glasses by Atomic Force Microscopy

Maximum entropy deconvolution of AFM & STM images

Development of crystallinity and morphology in hafnium dioxide thin films grown by Atomic Layer Epitaxy

In-Situ investigation of surface reactions on alkali halides by Atomic Force Microscopy

Surface analysis with Atomic Force Microscopy through measurements in air and under liquids

Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films

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