Research output

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  1. 2009
  2. Published

    Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

    Tejedor, P., Díez-Merino, L., Beinik, I. & Teichert, C., 2009, In: Applied physics letters. 95, p. 123103-1-123103-3

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Defektbildung und Ladungsträgereinfang in epitaktisch gewachsenen organischen Nanostrukturen

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  4. Published

    Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

    Shen, Q., Hlawacek, G., Flesch, H-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Ehrlich Schwoebel barriers in organic thin film growth

    Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  7. Published

    Exploring fundamental growth morphologies in organic thin film systems

    Teichert, C., 2009

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  8. Published

    Friction Force Microscopy characterization of organic thin films

    Shen, Q., 2009

    Research output: Thesis › Diploma Thesis

  9. Published

    Hierarchy of adhesion forces in patterns of photoreactive surface layers

    Hlawacek, G., Shen, Q., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2009, In: Journal of chemical physics (The journal of chemical physics). 130, p. 44703-1-44703-5

    Research output: Contribution to journal › Article › Research › peer-review

  10. Published

    High Resolution RBS on High-k Dielectrics

    Teichert, C., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  11. Published

    In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)

    Teichert, C. (ed.), 2009, Eigenverlag.

    Research output: Book/Report › Anthology › Research

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