Research output

281 - 286 out of 286Page size: 10

Sort by: Publication date

1994
Published
Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films
Prohaska, T., Ritala, M., Leskelä, M., Niinistö, L., FRIEDBACHER, G. & GRASSERBAUER, M., 1994, In: Thin solid films. p. 155-162
Research output: Contribution to journal › Article › Research › peer-review
Published
Validierung analytischer Methoden
Wegscheider, W., 1994, Akkreditierung und Qualitätssicherung in der Analytischen Chemie . Günzler, H. (ed.). Springer Berlin, p. 105-129
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
1987
Published
Background intensities and their utilization in quantitative analysis by monochromatically excited energy-dispersive X-ray fluorescence.
Rachetti, A. & Wegscheider, W., 1987, In: Advances in x-ray analysis. p. 143-151 9 p.
Research output: Contribution to journal › Article › Research › peer-review
1986
Published
Impact of Personal Computers and New Instrumentation on Environmental Applications of X-ray Fluorescence⁺
Leyden, D. E., Harding, A. R., Rachetti, A. & Wegscheider, W., 1 Oct 1986, In: International journal of environmental analytical chemistry. 27, 1-2, p. 69-80 12 p.
Research output: Contribution to journal › Article › Research › peer-review
Published
A fundamental parameters approach including scattered radiation for mono-energetically excited samples in energy-dispersive x-ray fluorescence spectrometry
Rachetti, A. & Wegscheider, W., 1986, In: Analytica chimica acta. 188, C, p. 37-50 14 p.
Research output: Contribution to journal › Article › Research › peer-review
Published
X-ray fluorescence raw intensities vs. concentration data for multivariate classification of hungarian coal
Rachetti, A., Wegscheider, W. & Borszéki, J., 1986, In: Analytica chimica acta. 191, C, p. 219-226 8 p.
Research output: Contribution to journal › Article › Research › peer-review

Previous 1...25 26 27 28 29 Next

Research Portal

Research output

Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films

Validierung analytischer Methoden

Background intensities and their utilization in quantitative analysis by monochromatically excited energy-dispersive X-ray fluorescence.

Impact of Personal Computers and New Instrumentation on Environmental Applications of X-ray Fluorescence⁺

A fundamental parameters approach including scattered radiation for mono-energetically excited samples in energy-dispersive x-ray fluorescence spectrometry

X-ray fluorescence raw intensities vs. concentration data for multivariate classification of hungarian coal

Advanced filters

Research Portal

Research output

Surface roughness reduction in Atomic Layer Epitaxy growth of titanium dioxide thin films

Validierung analytischer Methoden

Background intensities and their utilization in quantitative analysis by monochromatically excited energy-dispersive X-ray fluorescence.

Impact of Personal Computers and New Instrumentation on Environmental Applications of X-ray Fluorescence+

A fundamental parameters approach including scattered radiation for mono-energetically excited samples in energy-dispersive x-ray fluorescence spectrometry

X-ray fluorescence raw intensities vs. concentration data for multivariate classification of hungarian coal

Advanced filters

Impact of Personal Computers and New Instrumentation on Environmental Applications of X-ray Fluorescence⁺