Research output

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2002
Published
Characterization of silicon gate oxides by conducting atomic-force microscopy
Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172
Research output: Contribution to journal › Article › Research › peer-review
2000
Published
Pattern formation in PbTe multilayer films
Teichert, C., Jamnig, B. D. & Oswald, J., 2000, In: Surface Science. p. 823-826
Research output: Contribution to journal › Article › Research › peer-review
1999
Published
Ferromagnetic data store free from problems of relative positioning of a read-write device with a storage device
Teichert, C., 30 Sept 1999
Research output: Patent

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