Research output

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  1. 2006
  2. Published

    Microstructural aspects determining the adhesive wear of tool steels

    Fontalvo, G., Humer, R., Mitterer, C., Sammt, K. & Schemmel, I., 2006, In: Wear. 260, p. 1028-1034

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Microstructural design of hard coatings

    Mayrhofer, P. H., Mitterer, C., Hultman, L. & Clemens, H., 2006, In: Progress in materials science. 51, p. 1032-1114

    Research output: Contribution to journal › Article › Research › peer-review

  4. Published

    Morphologic characterization of organosilane self-assembled monolayers on SiO2

    Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Slugovc, C., Trimmel, G., Pacher, P., Proschek, V. & Zojer, E., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Multifunctional PVD Coatings for Cutting tools

    Pfeiler, M. & Mitterer, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  6. Published

    Multifunctional Thermal CVD (M) (S) (N) coatings for cutting

    Wagner, J. & Mitterer, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  7. Published

    NAMSOS Project (EC-STRP NMP 505854-1)

    Hofer, C. & Teichert, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  8. Published

    NAMSOS Project (EC-STRP NMP 505854-1), Final Report 2006

    Hofer, C. & Teichert, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  9. Published

    NANOSURFACEENGINEERING CENTER - Infrastrukturanschaffung

    Mitterer, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  10. Published

    NANOSURFACEENGINEERING CENTER - Planungsarbeiten für den Aufbau und die Laborausstattung

    Mitterer, C., 2006

    Research output: Book/Report › Commissioned report › Transfer › peer-review

  11. Published

    Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy

    Kremmer, S., Wurmbauer, H., Andreev, A., Teichert, C., Tallarida, G., Spiga, S., Wiemer, C. & Fanciulli, M., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

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