Research output

  1. 2003
  2. Published

    Molecular alignments in sexiphenyl thin films epitaxially grown on muscovite

    Plank, H., Resel, R., Sitter, H., Andreev, A., Sariciftci, N. S., Hlawacek, G., Teichert, C., Thierry, A. & Lotz, B., 2003, In: Thin solid films. 443, p. 108-114

    Research output: Contribution to journalArticleResearchpeer-review

  3. 2002
  4. Published
  5. Published

    Characterization of silicon gate oxides by conducting atomic-force microscopy

    Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2000
  7. Published

    Pattern formation in PbTe multilayer films

    Teichert, C., Jamnig, B. D. & Oswald, J., 2000, In: Surface Science. p. 823-826

    Research output: Contribution to journalArticleResearchpeer-review

  8. 1999
  9. Published
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