Scratch induced thin film buckling for quantitative adhesion measurements

Research output: Contribution to journalArticleResearchpeer-review

Authors

External Organisational units

  • Erich Schmid Institute of Materials Science
  • KAI - Kompetenzzentrum Automobil- und Industrieelektronik GmbH
  • Infineon Technologies AG Austria

Details

Original languageEnglish
Pages (from-to)203-211
Number of pages9
JournalMaterials and Design
Volume115.2018
Issue number5 October
DOIs
Publication statusE-pub ahead of print - 29 May 2018