Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems
Research output: Contribution to conference › Presentation › Research › peer-review
Standard
Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems. / Konetschnik, Ruth; Kozic, Darjan; Schöngrundner, Ronald et al.
2016. AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM, Saarbrücken, Germany.
2016. AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM, Saarbrücken, Germany.
Research output: Contribution to conference › Presentation › Research › peer-review
Harvard
Konetschnik, R, Kozic, D, Schöngrundner, R, Ganser, HP, Brunner, R & Kiener, D 2016, 'Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems', AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM, Saarbrücken, Germany, 14/03/16 - 15/03/16.
APA
Konetschnik, R., Kozic, D., Schöngrundner, R., Ganser, H. P., Brunner, R., & Kiener, D. (2016). Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems. AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM, Saarbrücken, Germany.
Vancouver
Konetschnik R, Kozic D, Schöngrundner R, Ganser HP, Brunner R, Kiener D. Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems. 2016. AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM, Saarbrücken, Germany.
Author
Bibtex - Download
@conference{5662ff84dd16437cb5a6ce81a1b6d043,
title = "Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems",
author = "Ruth Konetschnik and Darjan Kozic and Ronald Sch{\"o}ngrundner and Ganser, {Hans Peter} and Roland Brunner and Daniel Kiener",
year = "2016",
month = mar,
day = "15",
language = "English",
note = "AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM ; Conference date: 14-03-2016 Through 15-03-2016",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Residual Stresses and Fracture Toughness in Multi-layered Thin Film Systems
AU - Konetschnik, Ruth
AU - Kozic, Darjan
AU - Schöngrundner, Ronald
AU - Ganser, Hans Peter
AU - Brunner, Roland
AU - Kiener, Daniel
PY - 2016/3/15
Y1 - 2016/3/15
M3 - Presentation
T2 - AK-Treffen Rasterkraftmikroskopie und nanomechanische Methoden 2016, DGM
Y2 - 14 March 2016 through 15 March 2016
ER -
