Rapid determination of stress factors and residual stresses in anisotropic thin films
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Rapid determination of stress factors and residual stresses in anisotropic thin films. / Martinschitz, Klaus-Jürgen; Eiper, Ernst; Keckes, Jozef.
2006. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.
2006. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Martinschitz, K-J, Eiper, E & Keckes, J 2006, 'Rapid determination of stress factors and residual stresses in anisotropic thin films', 55th Annual Denver X-ray Conference, Denver, United States, 7/08/06 - 11/08/06.
APA
Martinschitz, K.-J., Eiper, E., & Keckes, J. (2006). Rapid determination of stress factors and residual stresses in anisotropic thin films. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.
Vancouver
Martinschitz KJ, Eiper E, Keckes J. Rapid determination of stress factors and residual stresses in anisotropic thin films. 2006. Poster session presented at 55th Annual Denver X-ray Conference, Denver, Colorado, United States.
Author
Bibtex - Download
@conference{ca65a43b91014f61bfbb4a3d38d94eba,
title = "Rapid determination of stress factors and residual stresses in anisotropic thin films",
author = "Klaus-J{\"u}rgen Martinschitz and Ernst Eiper and Jozef Keckes",
year = "2006",
language = "English",
note = "55th Annual Denver X-ray Conference ; Conference date: 07-08-2006 Through 11-08-2006",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Rapid determination of stress factors and residual stresses in anisotropic thin films
AU - Martinschitz, Klaus-Jürgen
AU - Eiper, Ernst
AU - Keckes, Jozef
PY - 2006
Y1 - 2006
M3 - Poster
T2 - 55th Annual Denver X-ray Conference
Y2 - 7 August 2006 through 11 August 2006
ER -
