Oxygen impurity related hardening mechanisms of Ti-Al-N thin films

Research output: Contribution to conferencePosterResearchpeer-review

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Oxygen impurity related hardening mechanisms of Ti-Al-N thin films. / Riedl, Helmut; Koller, Christian; Rachbauer, Richard et al.
2014. Poster session presented at 14th International Conference on Plasma Surface Engineering, Garmisch Partenkirchen, Germany.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Riedl, H, Koller, C, Rachbauer, R, Kolozsvari, S, Mendez Martin, F & Mayrhofer, PH 2014, 'Oxygen impurity related hardening mechanisms of Ti-Al-N thin films', 14th International Conference on Plasma Surface Engineering, Garmisch Partenkirchen, Germany, 15/09/14 - 19/09/14.

APA

Riedl, H., Koller, C., Rachbauer, R., Kolozsvari, S., Mendez Martin, F., & Mayrhofer, P. H. (2014). Oxygen impurity related hardening mechanisms of Ti-Al-N thin films. Poster session presented at 14th International Conference on Plasma Surface Engineering, Garmisch Partenkirchen, Germany.

Vancouver

Riedl H, Koller C, Rachbauer R, Kolozsvari S, Mendez Martin F, Mayrhofer PH. Oxygen impurity related hardening mechanisms of Ti-Al-N thin films. 2014. Poster session presented at 14th International Conference on Plasma Surface Engineering, Garmisch Partenkirchen, Germany.

Author

Riedl, Helmut ; Koller, Christian ; Rachbauer, Richard et al. / Oxygen impurity related hardening mechanisms of Ti-Al-N thin films. Poster session presented at 14th International Conference on Plasma Surface Engineering, Garmisch Partenkirchen, Germany.

Bibtex - Download

@conference{ca30158da7d14d1f9ef02be9443db363,
title = "Oxygen impurity related hardening mechanisms of Ti-Al-N thin films",
author = "Helmut Riedl and Christian Koller and Richard Rachbauer and S. Kolozsvari and {Mendez Martin}, Francisca and P.H. Mayrhofer",
year = "2014",
language = "English",
note = "14th International Conference on Plasma Surface Engineering ; Conference date: 15-09-2014 Through 19-09-2014",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Oxygen impurity related hardening mechanisms of Ti-Al-N thin films

AU - Riedl, Helmut

AU - Koller, Christian

AU - Rachbauer, Richard

AU - Kolozsvari, S.

AU - Mendez Martin, Francisca

AU - Mayrhofer, P.H.

PY - 2014

Y1 - 2014

M3 - Poster

T2 - 14th International Conference on Plasma Surface Engineering

Y2 - 15 September 2014 through 19 September 2014

ER -