Optical sensor setup for robust quality control measurement on large cylindrical structures
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Optical sensor setup for robust quality control measurement on large cylindrical structures. / Brandner, Markus; Thurner, Thomas.
Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions. Vol. 12 2005. p. 299-304.
Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions. Vol. 12 2005. p. 299-304.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Brandner, M & Thurner, T 2005, Optical sensor setup for robust quality control measurement on large cylindrical structures. in Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions. vol. 12, pp. 299-304.
APA
Brandner, M., & Thurner, T. (2005). Optical sensor setup for robust quality control measurement on large cylindrical structures. In Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions (Vol. 12, pp. 299-304)
Vancouver
Brandner M, Thurner T. Optical sensor setup for robust quality control measurement on large cylindrical structures. In Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions. Vol. 12. 2005. p. 299-304
Author
Bibtex - Download
@inproceedings{88a9ff1f5163409f8a0f97ee730e168c,
title = "Optical sensor setup for robust quality control measurement on large cylindrical structures",
author = "Markus Brandner and Thomas Thurner",
year = "2005",
language = "English",
volume = "12",
pages = "299--304",
booktitle = "Sensor - Internationale Messe mit Kongress f{\"u}r Sensoren, Messsysteme und Solutions",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Optical sensor setup for robust quality control measurement on large cylindrical structures
AU - Brandner, Markus
AU - Thurner, Thomas
PY - 2005
Y1 - 2005
M3 - Conference contribution
VL - 12
SP - 299
EP - 304
BT - Sensor - Internationale Messe mit Kongress für Sensoren, Messsysteme und Solutions
ER -