Nanometer Scale Characterization of Polypropylene Cast Film Surfaces
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Nanometer Scale Characterization of Polypropylene Cast Film Surfaces. / Resch, Katharina; Wallner, Gernot; Hlawacek, Gregor et al.
2005. Poster session presented at 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Erlangen, Germany.
2005. Poster session presented at 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Erlangen, Germany.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Resch, K, Wallner, G, Hlawacek, G, Teichert, C, Gahleitner, M & Binder, W 2005, 'Nanometer Scale Characterization of Polypropylene Cast Film Surfaces', 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Erlangen, Germany, 17/02/05 - 18/02/05.
APA
Resch, K., Wallner, G., Hlawacek, G., Teichert, C., Gahleitner, M., & Binder, W. (2005). Nanometer Scale Characterization of Polypropylene Cast Film Surfaces. Poster session presented at 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Erlangen, Germany.
Vancouver
Resch K, Wallner G, Hlawacek G, Teichert C, Gahleitner M, Binder W. Nanometer Scale Characterization of Polypropylene Cast Film Surfaces. 2005. Poster session presented at 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Erlangen, Germany.
Author
Bibtex - Download
@conference{76496b81de3b488f87703f5961bfec92,
title = "Nanometer Scale Characterization of Polypropylene Cast Film Surfaces",
author = "Katharina Resch and Gernot Wallner and Gregor Hlawacek and Christian Teichert and Markus Gahleitner and Wolfgang Binder",
year = "2005",
language = "English",
note = "6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft ; Conference date: 17-02-2005 Through 18-02-2005",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Nanometer Scale Characterization of Polypropylene Cast Film Surfaces
AU - Resch, Katharina
AU - Wallner, Gernot
AU - Hlawacek, Gregor
AU - Teichert, Christian
AU - Gahleitner, Markus
AU - Binder, Wolfgang
PY - 2005
Y1 - 2005
M3 - Poster
T2 - 6. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft
Y2 - 17 February 2005 through 18 February 2005
ER -
