Micron beam bending and compression tests - micromechanical properties of copper

Research output: Contribution to conferencePosterResearchpeer-review

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Micron beam bending and compression tests - micromechanical properties of copper. / Motz, Christian; Kiener, Daniel; Schöberl, Thomas et al.
2006. Poster session presented at 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany.

Research output: Contribution to conferencePosterResearchpeer-review

Harvard

Motz, C, Kiener, D, Schöberl, T & Dehm, G 2006, 'Micron beam bending and compression tests - micromechanical properties of copper', 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany, 5/09/06 - 7/09/06.

APA

Motz, C., Kiener, D., Schöberl, T., & Dehm, G. (2006). Micron beam bending and compression tests - micromechanical properties of copper. Poster session presented at 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany.

Vancouver

Motz C, Kiener D, Schöberl T, Dehm G. Micron beam bending and compression tests - micromechanical properties of copper. 2006. Poster session presented at 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany.

Author

Motz, Christian ; Kiener, Daniel ; Schöberl, Thomas et al. / Micron beam bending and compression tests - micromechanical properties of copper. Poster session presented at 7th European Symposium on nano-mechanical testing, Hückelhoven, Germany.

Bibtex - Download

@conference{bcea7aa151b44d54b9c56e56672dbb60,
title = "Micron beam bending and compression tests - micromechanical properties of copper",
author = "Christian Motz and Daniel Kiener and Thomas Sch{\"o}berl and Gerhard Dehm",
year = "2006",
language = "English",
note = "7th European Symposium on nano-mechanical testing ; Conference date: 05-09-2006 Through 07-09-2006",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Micron beam bending and compression tests - micromechanical properties of copper

AU - Motz, Christian

AU - Kiener, Daniel

AU - Schöberl, Thomas

AU - Dehm, Gerhard

PY - 2006

Y1 - 2006

M3 - Poster

T2 - 7th European Symposium on nano-mechanical testing

Y2 - 5 September 2006 through 7 September 2006

ER -