Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique
Research output: Contribution to journal › Article › Research › peer-review
Standard
Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique. / Pippan, Reinhard; Wurster, S.; Motz, Christian et al.
In: Advanced engineering materials, 2010, p. 61-63.
In: Advanced engineering materials, 2010, p. 61-63.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
Pippan, R, Wurster, S, Motz, C & Jenko, M 2010, 'Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique', Advanced engineering materials, pp. 61-63.
APA
Pippan, R., Wurster, S., Motz, C., & Jenko, M. (2010). Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique. Advanced engineering materials, 61-63.
Vancouver
Pippan R, Wurster S, Motz C, Jenko M. Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique. Advanced engineering materials. 2010;61-63.
Author
Bibtex - Download
@article{fc776012f613470b9109f75a9f9f89d8,
title = "Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique",
author = "Reinhard Pippan and S. Wurster and Christian Motz and M. Jenko",
year = "2010",
language = "English",
pages = "61--63",
journal = " Advanced engineering materials",
issn = "1438-1656",
publisher = "Wiley-VCH ",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Micrometer-Sized Specimen Preparation Based on Ion Slicing Technique
AU - Pippan, Reinhard
AU - Wurster, S.
AU - Motz, Christian
AU - Jenko, M.
PY - 2010
Y1 - 2010
M3 - Article
SP - 61
EP - 63
JO - Advanced engineering materials
JF - Advanced engineering materials
SN - 1438-1656
ER -
