Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Research output: Contribution to journal › Article › Research › peer-review
Standard
In: Applied surface science, Vol. 389.2016, No. 15 December, 15.12.2016, p. 783-789.
Research output: Contribution to journal › Article › Research › peer-review
Harvard
APA
Vancouver
Author
Bibtex - Download
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
AU - Kondratenko, Sergey V.
AU - Lysenko, V. S.
AU - Kozyrev, Yury N.
AU - Kratzer, Markus
AU - Storozhuk, D. P.
AU - Iliash, S. A.
AU - Czibula, Caterina Marina
AU - Teichert, Christian
PY - 2016/12/15
Y1 - 2016/12/15
KW - Carrier lifetime
KW - Heterostructures
KW - Quantum dots
KW - Recombination processes
UR - http://www.scopus.com/inward/record.url?scp=84982840776&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2016.07.148
DO - 10.1016/j.apsusc.2016.07.148
M3 - Article
AN - SCOPUS:84982840776
VL - 389.2016
SP - 783
EP - 789
JO - Applied surface science
JF - Applied surface science
SN - 0169-4332
IS - 15 December
ER -