Instrumented Milling Process and Analysis for Tool Wear Measurement
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Standard
Instrumented Milling Process and Analysis for Tool Wear Measurement. / Ninevski, Dimitar; Yifrach, Yitzchak; O'Leary, Paul.
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023). Kuala Lumpur, Malaysia: Institute of Electrical and Electronics Engineers, 2023.
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023). Kuala Lumpur, Malaysia: Institute of Electrical and Electronics Engineers, 2023.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Harvard
Ninevski, D, Yifrach, Y & O'Leary, P 2023, Instrumented Milling Process and Analysis for Tool Wear Measurement. in 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023). Institute of Electrical and Electronics Engineers, Kuala Lumpur, Malaysia.
APA
Ninevski, D., Yifrach, Y., & O'Leary, P. (2023). Instrumented Milling Process and Analysis for Tool Wear Measurement. In 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023) Institute of Electrical and Electronics Engineers.
Vancouver
Ninevski D, Yifrach Y, O'Leary P. Instrumented Milling Process and Analysis for Tool Wear Measurement. In 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023). Kuala Lumpur, Malaysia: Institute of Electrical and Electronics Engineers. 2023
Author
Bibtex - Download
@inproceedings{4a1def5a156e4ff2b0daa24b416d276a,
title = "Instrumented Milling Process and Analysis for Tool Wear Measurement",
author = "Dimitar Ninevski and Yitzchak Yifrach and Paul O'Leary",
year = "2023",
language = "English",
booktitle = "2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023)",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Instrumented Milling Process and Analysis for Tool Wear Measurement
AU - Ninevski, Dimitar
AU - Yifrach, Yitzchak
AU - O'Leary, Paul
PY - 2023
Y1 - 2023
M3 - Conference contribution
BT - 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (I2MTC 2023)
PB - Institute of Electrical and Electronics Engineers
CY - Kuala Lumpur, Malaysia
ER -
