Inspection of short surface cracks by inductive thermography and by computer tomography
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Thermosense: Thermal Infrared Applications XLVI. ed. / Fernando Lopez; Nicolas P. Avdelidis; Giovanni Ferrarini. SPIE, 2024. 130470P (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 13047).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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TY - GEN
T1 - Inspection of short surface cracks by inductive thermography and by computer tomography
AU - Oswald-Tranta, B.
AU - Hackl, A.
AU - Gorostegui-Colinas, E.
AU - Merino, A. Muniategui
AU - Westphal, Ph
N1 - Publisher Copyright: © 2024 SPIE.
PY - 2024
Y1 - 2024
KW - computer tomography(CT)
KW - crack characterization
KW - crack detection
KW - finite element simulation
KW - fluorescent penetrant test(FPT)
KW - Inductive thermography
UR - http://www.scopus.com/inward/record.url?scp=85202068053&partnerID=8YFLogxK
U2 - 10.1117/12.3013073
DO - 10.1117/12.3013073
M3 - Conference contribution
AN - SCOPUS:85202068053
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Thermosense
A2 - Lopez, Fernando
A2 - Avdelidis, Nicolas P.
A2 - Ferrarini, Giovanni
PB - SPIE
T2 - Thermosense: Thermal Infrared Applications XLVI
Y2 - 22 April 2024 through 25 April 2024
ER -
