In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending

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In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending. / Hintsala, E.; Kiener, D.; Jackson, J. et al.
In: Experimental mechanics, Vol. 55, No. 9, 01.11.2015, p. 1681-1690.

Research output: Contribution to journalArticleResearchpeer-review

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Hintsala E, Kiener D, Jackson J, Gerberich WW. In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending. Experimental mechanics. 2015 Nov 1;55(9):1681-1690. doi: 10.1007/s11340-015-0069-2

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Hintsala, E. ; Kiener, D. ; Jackson, J. et al. / In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending. In: Experimental mechanics. 2015 ; Vol. 55, No. 9. pp. 1681-1690.

Bibtex - Download

@article{099fe3102806472ebf64f52dab969eaf,
title = "In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending",
keywords = "Electron backscatter diffraction, Electron micrscopy, Fracture testing, Nanomechanics, Steel",
author = "E. Hintsala and D. Kiener and J. Jackson and Gerberich, {W. W.}",
year = "2015",
month = nov,
day = "1",
doi = "10.1007/s11340-015-0069-2",
language = "English",
volume = "55",
pages = "1681--1690",
journal = "Experimental mechanics",
issn = "0014-4851",
publisher = "Springer New York",
number = "9",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - In-Situ Measurements of Free-Standing, Ultra-Thin Film Cracking in Bending

AU - Hintsala, E.

AU - Kiener, D.

AU - Jackson, J.

AU - Gerberich, W. W.

PY - 2015/11/1

Y1 - 2015/11/1

KW - Electron backscatter diffraction

KW - Electron micrscopy

KW - Fracture testing

KW - Nanomechanics

KW - Steel

UR - http://www.scopus.com/inward/record.url?scp=84929703148&partnerID=8YFLogxK

U2 - 10.1007/s11340-015-0069-2

DO - 10.1007/s11340-015-0069-2

M3 - Article

AN - SCOPUS:84929703148

VL - 55

SP - 1681

EP - 1690

JO - Experimental mechanics

JF - Experimental mechanics

SN - 0014-4851

IS - 9

ER -